Small-Signal Discrete Tester
Amoeba 4100 is specifically designed for small-signal discrete devices testing.
It is the world fastest discrete tester with a test time of <40ms for transistors and <20ms for diodes.
With true multi-site test capability, you can hook up with up to 127 Amoeba 4100's to achieve the highest throughput.
- Fastest discrete tester in the industry
- Unmatchable test time of <40ms for transistors and <20ms for diodes
- True multi-site testing, up to unmatchable 127 simultaneous sites with >95% efficiency
- Modular and highly scalable design, don’t pay for what you don’t need (for now)
- Seamless extension of test resources and test sites, add-on whenever you need
- Flexible tester-handler configuration – index-parallel, test-time division, multi-sites on single handler, etc
- Independent test flows running on one screen for independent tester-handler operation
- Industry’s leading discrete vectorization (AVEC-D) to optimize test time and eliminate O/S latency