• Amoeba 4600
    Digital/Mixed Signal (with RF Option)
    Amoeba AMB4600 is the world's first highly reconfigurable ATE test platform; test systems are interchangeable among Digital, Analog, or RF/Mixed Signal capabilities.

    In view of space limitation, AMB4600 is specifically designed to replace test giants with its smaller footprint. Eventually the capital cost in line with the growth of Internet of Things (IoT), Cloud Computing, and Cost of Test (CoT) will be reduced gradually. 

    AMB4600 is compacted for multiplex testing including microcontrollers (wireless/non-wireless), connectivity modules, baseband, RF Transceivers, Wireless SoCs, and Pre-Amplifiers.
     
     


    Purpose
    RF
    Analog
    Digital
    Discrete
    Features
    • Scalability and modularity inherited from PXIe platform
    • Reconfigurable platform – from pure Digital ATE to a Mixed Signal/RF ATE Platform
    • Multi-Instance Production Software 
    • Multi-Test-Site Configurations 
    • Flexible RF Accessories Integration for High Power RF Testing 
    • Easy Development-to-Production Migration 
    • Lowest initial Capex Investment cost 
    • Expandability from Single Site to Octal Site
     
    Reality Checked: Small footprint 
     
    First from Aemulus with a direct-docking tester for wafer probing solution. It is compact yet complex; sized only a third of ‘Big Iron’ but able to support parallel testing for interchangeable test systems. 
     
     
    Product Applications
    Device-Under-Test Type
    Applicable
    Microcontrollers
    Yes
    FPGA/CPLDs
    Yes
    Baseband Devices
    Yes
    RF Transceivers
    Yes*
    Connectivity SoCs
    Yes*
    RF Tuneres
    Yes*
    RF Power Amplifier, 
    FEMS switches,
    Yes*

    PMICs
    Yes
    Analog Transceivers
    Yes
    PreAmplifiers
    Yes
       *with RF Options
     
     
     
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