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Discrete

Amoeba 4100-D

Amoeba™ 4100-D

Small-Signal Discrete Tester

Amoeba™ series, AMB4100 is specifically designed for small-signal discrete devices testing.

It is the world fastest discrete tester with a test time of <40ms for transistors and <20ms for diodes.

With true multi-site test capability, you can hook up with up to 127 Amoeba 4100's to achieve the highest throughput.

Highlights

Fastest discrete tester in the industry

Unmatchable test time of <40ms for transistors and <20ms for diodes

True multi-site testing, up to unmatchable 127 simultaneous sites with >95% efficiency

Modular and highly scalable design, don’t pay for what you don’t need (for now)

Seamless extension of test resources and test sites, add-on whenever you need

Flexible tester-handler configuration – index-parallel, test-time division, multi-sites on single handler, etc

Independent test flows running on one screen for independent tester-handler operation

Industry’s leading discrete vectorization (AVEC-D) to optimize test time and eliminate O/S latency

Configurations

AMB4100-D architecture provides the highest flexibility for integration to wafer probers and final test handlers.

Configuration 1 - Single Handler

True Parallelism Multi-site testing where all devices can be tested in parallel. Index parallel can be achieved by splitting test parameters in cases where handler indexing time > tester test time.

Configuration 2 - Dual Handler

Ping Pong Testing can be achieved where DUT is tested on 1 handler while another handler is indexing. Single tester with the capability to produce twice the UPH compared to single handler configuration.

Configuration 3 - Quad Handler

Optimized Test Cost with 4x UPH achieved by a single tester configuration. Saves production floor space, improves maintenance and achieving the lowest CoT (Cost of Test)

techFlow 2.0 Software

Sequencing algorithm for maximum testing performance

Supports multiple instances for multi-site testing

Supports parameterized test item for enhanced flexibility and reduced test program recompilation frequency

Role-Based Permission Matrix for more fine-grained permission control

Enhanced APIs to support test name abstraction allowing more generic test programs

Supports UUT number management from techFlow

AVEC-D Compiler 1.0

Supports patent-pending Analog Vectors Discrete (AVEC-D) for increased testing performance

Supports compile-time Tcl-script-based variables and control constructs like if…else, for loop, etc. for enhanced productivity

Command line-based compiler enables batch processing and invoking from within test programs

Hardware

AMB4100-D Hardware

Slot	Card	Mandatory
1	DM370	Yes
2	PSM120	Yes
3	DTM120	Yes
4	DTM220	Yes
5	IOM300	Yes

AMB4100-D Head Amp Module

Integrated relay and control modules

Placed near to DUT for optimized test setup and easy cabling maintenance.

Specifications

400V (max) with 12 voltage ranges

3A (max) with 9 current ranges

High accuracy – Minimum of 0.1% of range 0.1% of reading

Optimized low current measurement down to pA levels

15-bits force/sense resolution Kelvin sensing

110-240V Input Voltage, 50-60Hz

Relay switching time as low as 1ms

20ms (50Hz)/ 16.67ms (60Hz) software selectable integration time